Title :
Conducted EMC prediction for a power converter with SiC components
Author :
Rondon, Eliana ; Morel, Florent ; Vollaire, Christian ; Ferber, Moises ; Schanen, Jean-Luc
Author_Institution :
Lab. Ampere, Univ. de Lyon, Écully, France
Abstract :
This paper presents a model of a power converter with SiC components in order to predict the conducted perturbation that it generates (at the LISN level). Some methods to create a model of any passive elements (parasitic capacitance and inductance, decoupling capacitors, load, LISN) as an equivalent circuit are shown. Finally the complete model of the converter is presented and confronted to experimental measurements. Comparisons show a good behaviour until 30MHz.
Keywords :
electromagnetic compatibility; equivalent circuits; power convertors; silicon compounds; wide band gap semiconductors; SiC; SiC components; conducted EMC prediction; electromagnetic compatibility; equivalent circuit; passive elements; power converter; Abstracts; Electromagnetic compatibility; Frequency measurement; Impedance; Impedance measurement; Indium phosphide; Phase measurement;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237867