DocumentCode :
2593762
Title :
BIST analyzer: A training platform for SoC testing
Author :
Jutman, Artur ; Tsertov, A. ; Tsepurov, A. ; Aleksejev, I. ; Ubar, R. ; Wuttke, H.-D.
Author_Institution :
Tallinn Univ. of Technol., Tallinn
fYear :
2007
fDate :
10-13 Oct. 2007
Abstract :
Linear feedback shift registers (LFSR) and other pseudo-random pattern generators (PRPG) have become one of the central elements used in testing and self testing of contemporary complex electronic systems like processors, controllers, and high-performance integrated circuits. The current paper describes a training and research tool for learning basic and advanced issues related to PRPG-based test pattern generation. Unlike other similar systems, this tool facilitates study of various test optimization problems, allows fault coverage analysis for different circuits and with different LFSR parameters. The main didactic aim of the tool is presenting complicated concepts in a comprehensive graphical and analytical way. The multi-platform JAVA runtime environment allows for easy access and usage of the tool both in a classroom and at home. The BIST analyzer represents an integrated simulation, training, and research environment that supports both analytic and synthetic way of learning. Due to the above mentioned facts the tool provides a unique training platform to use in courses on electronic testing and design for testability. The BIST Analyzer has got a positive feedback from students of Darmstadt TU (Germany) and Tallinn TU (Estonia).
Keywords :
Java; automatic test pattern generation; built-in self test; computer aided instruction; design for testability; educational courses; electronic engineering computing; electronic engineering education; shift registers; system-on-chip; BIST analyzer; JAVA runtime environment; SoC testing; design for testability; electronic testing; fault coverage analysis; linear feedback shift registers; pseudo-random pattern generators; test pattern generation; Automatic testing; Built-in self-test; Centralized control; Circuit testing; Electronic equipment testing; Integrated circuit testing; Linear feedback control systems; Linear feedback shift registers; System testing; Test pattern generators; Courses on electronic testing and design; Java platform; Training and research tool; Web-based training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontiers In Education Conference - Global Engineering: Knowledge Without Borders, Opportunities Without Passports, 2007. FIE '07. 37th Annual
Conference_Location :
Milwaukee, WI
ISSN :
0190-5848
Print_ISBN :
978-1-4244-1083-5
Electronic_ISBN :
0190-5848
Type :
conf
DOI :
10.1109/FIE.2007.4418125
Filename :
4418125
Link To Document :
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