Title :
Conducted interferences of power converters with parametric uncertainties in the frequency domain
Author :
Ferber, Matthew ; Vollaire, Christian ; KrahenbUhl, Laurent ; Coulomb, Jean-Louis ; Vasconcelos, Joao A.
Author_Institution :
ECL, Lab. Ampere, Univ. de Lyon, Ecully, France
Abstract :
This paper presents a new methodology to analyse the conducted interferences of power converters when its parameters are described by probability density functions rather than numerical values. The methodology has several advantages when compared to classical approaches, such as Monte Carlo and Collocation methods. The results are presented as probability density functions and confidence intervals.
Keywords :
Monte Carlo methods; electromagnetic compatibility; electromagnetic wave interference; power convertors; probability; EMC; Monte Carlo; collocation methods; frequency domain; numerical values; parametric uncertainties; power converters interferences; probability density functions; Electromagnetic compatibility; Electrostatics; Production; Standards;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237869