Title :
Studies of TEM mode assumption on via holes in via modelings
Author :
Zhang, Yao-Jiang ; Jing, Shenhui ; Fan, Jun
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
The assumption of transverse electromagnetic (TEM) field distribution on via holes is checked by a two-dimensional (2D) finite difference method (FDM). It is found that for a via without pad, TEM mode assumption is a quite good approximation. However, for a via with a pad, i.e. the via pad radius is different from the via barrel radius, the field distribution on the via hole begins to deviate from the TEM mode. This indicates previous analytical formula for a via with pad may need to be modified at very high frequencies due to its usage of TEM field assumption on via holes. The results obtained by 2D FDM have been verified by a three-dimensional commercial electrostatic solver.
Keywords :
electromagnetic field theory; electrostatics; finite difference methods; 2D FDM; TEM field assumption; TEM mode assumption; barrel radius; holes; three-dimensional commercial electrostatic solver; transverse electromagnetic field distribution; two dimensional finite difference method; Approximation methods; Capacitance; Electromagnetics; Frequency division multiplexing; Integrated circuit modeling; Nonhomogeneous media; Printed circuits;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237873
