DocumentCode
2593931
Title
IC-EMC model extension based on internal impulse response function
Author
Yuan, Shih-Yi ; Huang, Jiun-Jia ; Hsu, Chia-Yuan ; Liao, Shry-Sann ; Tang, Chi-Chin ; Wu, Haw-Yu
Author_Institution
Dept. of Commun. Eng., Feng Chia Univ., Taichung, Taiwan
fYear
2012
fDate
21-24 May 2012
Firstpage
13
Lastpage
16
Abstract
This paper proposes a method for microcontroller´s IC-EMC model extension. The internal impedance can be estimated without any prior knowledge of microcontroller. The internal impedance is represented by “impulse response” (IR) function and built into an extended IC-EMC model. Theoretical deduction, simulation, and a case study are presented in this paper. Currently, the case study shows that the proposed method is accurate within limited bandwidth (below 30 MHz) due to measurement limitations and is expected to be more accurate with more advanced equipments. This method can help IC design companies to keep their intellectual properties (IP) inside while providing an IP-unrelated EMC model for IC-EMC modellers. It can also help IC-EMC modellers to determine different IC´s internal impedance by themselves.
Keywords
electric impedance; electromagnetic compatibility; industrial property; integrated circuit design; microcontrollers; semiconductor process modelling; transient response; IC design companies; IC internal impedance; IP-unrelated EMC model; IR function; intellectual properties; internal impulse response function; limited bandwidth; measurement limitations; microcontroller IC-EMC model extension; microcontroller knowledge; Electromagnetic compatibility; Electromagnetic interference; Estimation; Integrated circuit modeling; Mathematical model; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4577-1557-0
Electronic_ISBN
978-1-4577-1558-7
Type
conf
DOI
10.1109/APEMC.2012.6237877
Filename
6237877
Link To Document