• DocumentCode
    25940
  • Title

    94-GHz Large-Signal Operation of AlInN/GaN High-Electron-Mobility Transistors on Silicon With Regrown Ohmic Contacts

  • Author

    Marti, Diego ; Tirelli, Stefano ; Teppati, Valeria ; Lugani, Lorenzo ; Carlin, Jean-Francois ; Malinverni, Marco ; Grandjean, Nicolas ; Bolognesi, C.R.

  • Author_Institution
    MillimeterWave Electron. Group, ETH Zurich, Zurich, Switzerland
  • Volume
    36
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    17
  • Lastpage
    19
  • Abstract
    We report the first 94-GHz (W-band) large-signal performance of AlInN/GaN high-electron-mobility transistors (HEMTs) grown on high-resistivity silicon (111) substrates. A maximum output power density of 1.35 W/mm and peak power-added-efficiency of 12% are measured at 94 GHz. The devices exhibit a dc maximum current drain density of 1.6 A/mm and a peak transconductance of 650 mS/mm. In small-signal operation, cutoff frequencies fT/fMAX = 141/232 GHz are achieved. The large-signal performance of our AlInN/GaN HEMTs on silicon at 94 GHz stills lags the best reported results one on SiC substrates but nevertheless confirms the tremendous interest of GaN-on-Si HEMT technology for low-cost millimeterwave electronic applications.
  • Keywords
    III-V semiconductors; aluminium compounds; elemental semiconductors; gallium compounds; high electron mobility transistors; indium compounds; millimetre wave field effect transistors; ohmic contacts; semiconductor growth; silicon; wide band gap semiconductors; AlInN-GaN; HEMTs; Si; W-band large-signal performance; dc maximum current drain density; frequency 141 GHz; frequency 94 GHz; high-resistivity silicon (111) substrates; large-signal operation; low-cost millimeterwave electronic applications; regrown ohmic contacts; Gallium nitride; HEMTs; Logic gates; MODFETs; Performance evaluation; Power generation; Silicon; AlInN/GaN on Si; HEMTs; large-signal; load-pull characterization;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2367093
  • Filename
    6945795