Title :
Reliability improvement of FB inverter in HID lamp ballast using UniFET™ II MOSFET family
Author :
Kang, Won-Seok ; Yeon, Jae-Eul ; Kim, Hee-Jun ; Ahn, Tae-Young
Author_Institution :
Syst. & Applic. Group, Fairchild Semicond., Bucheon, South Korea
Abstract :
This paper introduces a newly developed UniFET™ II MOSFET family of which the body diode characteristic has been highly improved and presents its effectiveness for the mixed frequency switching inverter leg in the HID lamp ballast. Its reverse recovery time, Trr of the body diode is 35 nsec and the peak value of reverse current, irr is also much smaller than that of the typical MOSFET and even smaller than FRD´s. Therefore, it can ensure the better reliability in the switching inverter applications in which the performance of the MOSFET body diode is significant. In order to verify the validity, an experiment with an 150W HID lamp ballast was implemented and its results and effectiveness are presented in this paper.
Keywords :
MOSFET; discharge lamps; invertors; lamp accessories; reliability; switching convertors; FB inverter; FRD; HID lamp ballast; MOSFET body diode; UniFET II MOSFET family; mixed frequency switching inverter; power 150 W; reliability improvement; time 35 ns; MOSFET circuits; Reliability; Resonant frequency; Switching circuits;
Conference_Titel :
Telecommunications Energy Conference (INTELEC), 2011 IEEE 33rd International
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4577-1249-4
Electronic_ISBN :
2158-5210
DOI :
10.1109/INTLEC.2011.6099722