Title :
Effect of Morphological Structure on Electroluminescence and Breakdown in Polyethylene
Author :
Han, Suh Joon ; Gross, Laurence H.
Author_Institution :
Dow Chem. Co., Piscataway, NJ
Abstract :
Electrical degradation of insulation in power cables can sometimes be associated with defects at the interface between the semiconductive shield and the dielectric insulation. The interfacial region between the semiconductive shield and insulation is a special region, which would be influenced by an evolution of the local morphological characteristics. In this study, we investigated the pre-breakdown of various polyethylenes under divergent electric fields, by semicon needles, utilizing electroluminescence behavior. The effect of polyethylene insulation morphology was also correlated to dielectric breakdown.
Keywords :
electric breakdown; electroluminescence; polyethylene insulation; power cable insulation; dielectric breakdown; dielectric insulation; divergent electric fields; electrical degradation; electroluminescence morphological structure effect; polyethylene breakdown; power cable insulation; semicon needles; semiconductive shield; Cable insulation; Degradation; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Electroluminescence; Morphology; Needles; Polyethylene; Power cables;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
Conference_Location :
Quebec, QC
Print_ISBN :
978-1-4244-2548-8
Electronic_ISBN :
978-1-4244-2549-5
DOI :
10.1109/CEIDP.2008.4772774
