• DocumentCode
    2594107
  • Title

    Effect of Morphological Structure on Electroluminescence and Breakdown in Polyethylene

  • Author

    Han, Suh Joon ; Gross, Laurence H.

  • Author_Institution
    Dow Chem. Co., Piscataway, NJ
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    555
  • Lastpage
    558
  • Abstract
    Electrical degradation of insulation in power cables can sometimes be associated with defects at the interface between the semiconductive shield and the dielectric insulation. The interfacial region between the semiconductive shield and insulation is a special region, which would be influenced by an evolution of the local morphological characteristics. In this study, we investigated the pre-breakdown of various polyethylenes under divergent electric fields, by semicon needles, utilizing electroluminescence behavior. The effect of polyethylene insulation morphology was also correlated to dielectric breakdown.
  • Keywords
    electric breakdown; electroluminescence; polyethylene insulation; power cable insulation; dielectric breakdown; dielectric insulation; divergent electric fields; electrical degradation; electroluminescence morphological structure effect; polyethylene breakdown; power cable insulation; semicon needles; semiconductive shield; Cable insulation; Degradation; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Electroluminescence; Morphology; Needles; Polyethylene; Power cables;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
  • Conference_Location
    Quebec, QC
  • Print_ISBN
    978-1-4244-2548-8
  • Electronic_ISBN
    978-1-4244-2549-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2008.4772774
  • Filename
    4772774