Title :
Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs
Author :
Kwak, Sang Keun ; Jo, Jeong Min ; Noh, Seok Soon ; Lee, Hye Sook ; Nah, Wansoo ; Kim, So Young
Author_Institution :
Dept. of Semicond. Syst. Eng., Sungkyunkwan Univ., Suwon, South Korea
Abstract :
This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor.
Keywords :
buffer circuits; directional couplers; integrated memory circuits; mobile handsets; printed circuits; pulse generators; radiofrequency integrated circuits; BCI test; I-O buffer model; PCB; PKG; bulk current injection test modeling; directional coupler; input-output buffer circuit; mobile IC; mobile system memory; on-chip decoupling capacitor; power decoupling capacitor; pulse generator; voltage 1.8 V; Capacitors; Energy management; Generators; Immunity testing; Integrated circuit modeling; Radio frequency;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237908
