• DocumentCode
    2594837
  • Title

    Self-Immunity Technique to Improve Register File Integrity Against Soft Errors

  • Author

    Amrouch, Hussam ; Henkel, Joerg

  • Author_Institution
    Dept. of Embedded Syst., Karlsruhe Inst. of Technol., Karlsruhe, Germany
  • fYear
    2011
  • fDate
    2-7 Jan. 2011
  • Firstpage
    189
  • Lastpage
    194
  • Abstract
    Continuous shrinking in feature size, increasing power density etc. increase the vulnerability of microprocessors against soft errors even in terrestrial applications. The register file is one of the essential architectural components where soft errors can be very mischievous because errors may rapidly spread from there throughout the whole system. Thus, register files are recognized as one of the major concerns when it comes to reliability. This paper introduces Self-Immunity, a technique that improves the integrity of the register file with respect to soft errors. Based on the observation that a certain number of register bits are not always used to represent a value stored in a register. This paper deals with the difficulty to exploit this obvious observation to enhance the register file integrity against soft errors. We show that our technique can reduce the vulnerability of the register file considerably while exhibiting smaller overhead in terms of area and power consumption compared to state-of-the-art in register file protection.
  • Keywords
    file organisation; microprocessor chips; power aware computing; software architecture; software reliability; microprocessors; power density; register bits; register file integrity protection; self-immunity technique; soft error; Benchmark testing; Computer architecture; Decoding; Fault tolerance; Program processors; Registers; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design (VLSI Design), 2011 24th International Conference on
  • Conference_Location
    Chennai
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-61284-327-8
  • Electronic_ISBN
    1063-9667
  • Type

    conf

  • DOI
    10.1109/VLSID.2011.68
  • Filename
    5718800