Title :
Object shape and reflectance property measurement using multiple illumination scanner
Author :
Ukida, Hideyuki ; Tanimoto, Yuta ; Sano, Tomomi ; Yamamoto, Hiroshi
Author_Institution :
Fac. of Eng., Univ. of Tokushima, Tokushima, Japan
Abstract :
In this study, we propose a method to estimate 3D shape, color and specular reflections of an object using an image scanner with multiple illuminations. In the first process, we estimate an initial shape of the object. Several scanned images taken by illuminations located on the circumference are used to estimate object shape by the photometric stereo using average images reducing the specular reflection. In the second process, the object shape, color and specular components are estimated by an iterative process. In experiments, we show the estimation of the shape, color and specular components using synthetic images, and we confirm the effectiveness of our proposed methods.
Keywords :
image colour analysis; image scanners; iterative methods; parameter estimation; photometry; shape measurement; stereo image processing; color estimation; image scanner; iterative process; multiple illumination; object shape estimation; photometric stereo image; reflectance property measurement; specular component estimation; Charge coupled devices; Color; Light sources; Lighting; Manufacturing; Optical reflection; Photometry; Reflectivity; Shape measurement; Surface reconstruction; 3D shape measurement; image scanner; multiple light source; photometric stereo; specular reflection;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168411