DocumentCode :
2595026
Title :
A tool for quality controls in industrial process
Author :
Lazzaroni, M.
Author_Institution :
Dipt. di Tecnol. dell´Inf., Univ. degli Studi di Milano, Crema, Italy
fYear :
2009
fDate :
5-7 May 2009
Firstpage :
68
Lastpage :
73
Abstract :
Statistical process control (SPC) is actually used in order to reduce non conformity (NC), defects and waste. Traditional approach to industrial process and quality control depends on the production department of the industries to screen out items which do not meet the wanted requirements. This is often due to variation of the parameters under test. However, it would be considered that it is very difficult to assign causes of variation because they are often not well known. A loss in quality control in industrial process leads to financial losses due to, for example, process downtime. Thus, SPC is often evaluated and the most used approach is the use of computer based tools. Many computer based tools for statistical process control were developed in past and are today available. These tools are able to collect data from field and to perform statistical evaluation that can be used in order to find assignable causes of variation in products quality. However, the available tools, i.e. software, are not always able to correlate the practical causes of faults and the non conformity events. At this aim, a tool able to give a feedback for design, research and development and production department can be very useful and a software ad hoc designed at this aim will be presented and discussed in this paper.
Keywords :
production control; quality control; statistical process control; computer based tools; design feedback; financial losses; nonconformity defect reduction; nonconformity waste reduction; process downtime; production quality control; statistical process control; Feedback; Industrial control; Performance evaluation; Process control; Production; Quality control; Research and development; Software design; Software tools; Testing; Control charts; Pareto chart; Quality Control; Statical Process Control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
ISSN :
1091-5281
Print_ISBN :
978-1-4244-3352-0
Type :
conf
DOI :
10.1109/IMTC.2009.5168418
Filename :
5168418
Link To Document :
بازگشت