• DocumentCode
    2595122
  • Title

    Impacts of EMI filter on high speed interconnects for digital circuits design

  • Author

    Chang, R.W.-Y. ; Kye-Yak See ; Wei-Shan Soh ; Yew-Huat Ong ; Wenjun Huang

  • Author_Institution
    Guided Syst. Div., DSO Nat. Labs., Singapore, Singapore
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    413
  • Lastpage
    416
  • Abstract
    Today´s digital data lines are clocking at very high speed, in excess of 100MHz with rise time in the sub-nano second range. The effects of EMI radiation even from short traces are becoming significant and cannot be ignored. The use of resistive termination versus the EMI filter has long been a compromise in terms of cost and necessity. EMI compliance is now becoming a major design challenge for product development rather than a mere good-to-have specification of low emission. This paper carries out a comprehensive study on filter selection, application, impact on receiver waveform signal integrity and far-field emission suppression using a full-wave electromagnetic simulator (CST Microwave Studio). This study will provide high-speed digital designers an in-depth assessment of the use of EMI filter for radiation suppression in high-speed digital layout.
  • Keywords
    electromagnetic interference; filters; interference suppression; CST Microwave Studio; EMI filter; EMl compliance; EMl radiation effects; clocking; digital circuits design; digital data lines; far-field emission suppression; filter selection; full-wave electromagnetic simulator; high speed interconnects; high-speed digital designers; high-speed digital layout; product development; radiation suppression; receiver waveform signal integrity; Electromagnetic interference; Microwave filters; Resistors; EMI filter; emission suppression; high-speed digital design; resistive termination; signal integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1557-0
  • Electronic_ISBN
    978-1-4577-1558-7
  • Type

    conf

  • DOI
    10.1109/APEMC.2012.6237948
  • Filename
    6237948