Title :
MEMS-Based Power Gating for Highly Scalable Periodic and Event-Driven Processing
Author :
Henry, Michael B. ; Lyerly, Robert ; Nazhandali, Leyla ; Fruehling, Adam ; Peroulis, Dimitrios
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
Abstract :
For periodic and event-driven applications with long standby times, controlling leakage is essential. This paper investigates using MEMS switches for power gating processors, which eliminates standby leakage power and allows for highly scalable processing. We show that when power gating with a MEMS switch, low technology nodes and low threshold voltages, which offer low switching energy and high speeds, are optimal. We also compare a MEMS-gated processor to two recent low leakage processors and show that it is ideal for applications with 100+ ms standby times. With CMOS compatibility on the horizon, MEMS switches are an attractive option for low-leakage applications.
Keywords :
CMOS integrated circuits; microswitches; CMOS compatibility; MEMS switches; MEMS-gated processor; event-driven processing; leakage processors; power gating processors; scalable periodic; standby leakage power; switching energy; threshold voltages; CMOS integrated circuits; Contacts; Logic gates; Micromechanical devices; Microswitches; Program processors; Threshold voltage;
Conference_Titel :
VLSI Design (VLSI Design), 2011 24th International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-61284-327-8
Electronic_ISBN :
1063-9667
DOI :
10.1109/VLSID.2011.66