• DocumentCode
    2595164
  • Title

    LA-LRU: A Latency-Aware Replacement Policy for Variation Tolerant Caches

  • Author

    Jain, Aarul ; Shrivastava, Aviral ; Chakrabarti, Chaitali

  • Author_Institution
    Cambridge Silicon Radio, Phoenix, AZ, USA
  • fYear
    2011
  • fDate
    2-7 Jan. 2011
  • Firstpage
    298
  • Lastpage
    303
  • Abstract
    Parameter variations in deep sub-micron integrated circuits cause chip characteristics to deviate during semiconductor fabrication process. These variations are dominant in memory systems such as caches and the delay spread due to process variation impacts the performance of a cache based system significantly. In this paper, we propose two schemes to reduce the performance impact of variations in caches: i) Latency-Aware Least Recently Used (LA-LRU) replacement policy which ensures that cache blocks that are affected by process variation are accessed less frequently, and ii) Block Rearrangement scheme that distributes cache blocks with high latencies to all sets uniformly. We implemented our schemes on the Wattch Simple Scalar toolset for Xscale, PowerPC and Alpha21264-like processor configurations. Our experiments on SPEC 2000 benchmarks show that our scheme improves the average memory access time of caches by 11% to 22%, almost eliminating any performance degradation due to variations. We also synthesized the LA-LRU logic, to find out that we can obtain this benefit at negligible increase in the power consumption of the cache.
  • Keywords
    cache storage; integrated circuit design; Alpha21264 like processor; LA-LRU; PowerPC; SPEC 2000 benchmarks; Wattch Simple Scalar toolset; block rearrangement scheme; cache blocks; deep submicron integrated circuits; latency aware least recently used replacement policy; latency aware replacement policy; power consumption; semiconductor fabrication process; variation tolerant caches; Benchmark testing; Decoding; Degradation; Delay; Mathematical model; Nickel; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design (VLSI Design), 2011 24th International Conference on
  • Conference_Location
    Chennai
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-61284-327-8
  • Electronic_ISBN
    1063-9667
  • Type

    conf

  • DOI
    10.1109/VLSID.2011.24
  • Filename
    5718818