DocumentCode :
2595191
Title :
Investigation on the effect of parasitic inductance at connector contact boundary on electromagnetic radiation
Author :
Hayashi, Yu-ichi ; Matsuda, Kazuki ; Mizuki, Takaaki ; Sone, Hideaki
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
65
Lastpage :
68
Abstract :
A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.
Keywords :
electromagnetic devices; interference suppression; connector contact boundary; electric devices; electromagnetic radiation; electromagnetic radiation suppression; high-frequency bands; high-frequency circuit element estimation; parasitic inductance effect; Abstracts; Current measurement; Educational institutions; Estimation; Inductance; Inductance measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
Type :
conf
DOI :
10.1109/APEMC.2012.6237952
Filename :
6237952
Link To Document :
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