Title :
A single chip broadband noise source for noise measurements at cryogenic temperatures
Author :
Bruch, Daniel ; Schafer, Frank ; Aja, B. ; Leuther, A. ; Seelmann-Eggebert, Matthias ; Kallfass, I. ; Schlechtweg, Michael ; Ambacher, Oliver
Author_Institution :
Fraunhofer IAF, Freiburg, Germany
Abstract :
Summary form only given, as follows. This paper presents the design and performance of a single-chip broadband noise source for on-chip measurements in a cryogenic environment. The noise source generates input noise powers, Pc and Ph, which are required by the Y-factor method. High accuracy in temperature control and impedance presented to the DUT is achieved over a wide temperature range from 7 K to 100 K. Noise temperature measurements of a cryogenic LNA were performed on-chip and show a typical accuracy of ±1 K.
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5973364