• DocumentCode
    2595195
  • Title

    A single chip broadband noise source for noise measurements at cryogenic temperatures

  • Author

    Bruch, Daniel ; Schafer, Frank ; Aja, B. ; Leuther, A. ; Seelmann-Eggebert, Matthias ; Kallfass, I. ; Schlechtweg, Michael ; Ambacher, Oliver

  • Author_Institution
    Fraunhofer IAF, Freiburg, Germany
  • fYear
    2011
  • fDate
    5-10 June 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given, as follows. This paper presents the design and performance of a single-chip broadband noise source for on-chip measurements in a cryogenic environment. The noise source generates input noise powers, Pc and Ph, which are required by the Y-factor method. High accuracy in temperature control and impedance presented to the DUT is achieved over a wide temperature range from 7 K to 100 K. Noise temperature measurements of a cryogenic LNA were performed on-chip and show a typical accuracy of ±1 K.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-61284-754-2
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2011.5973364
  • Filename
    5973364