Title :
On-chip intra decoupling measurements for integrated magnetic thin film
Author :
Kodate, Wataru ; Endo, Yasushi ; Yamaguchi, Masahiro
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
Abstract :
Performance of magnetic thin-film is evaluated as a candidate for on-chip noise suppressor. Miniature loops coils implemented on a 90 nm design test element group (TEG) chip are used as the noise transmitter and receiver. Differential transmission parameter Sdd21 is evaluated as a measure of inductive noise intra-decoupling. Magnetic film is useful for frequency selective noise decoupler. The coupling is supported most at the ferromagnetic resonance (FMR) frequency, which is deviated from its intrinsic frequency and the degree of deviation can be calculated by using characteristic length. These results demonstrate that the proposed method is useful to characterize the IC chip level noise suppressor in the GHz range.
Keywords :
Long Term Evolution; ferromagnetic resonance; magnetic thin films; radio receivers; radio transmitters; FMR frequency; IC chip level noise suppressor; Long Term Evolution; differential transmission parameter Sdd21; ferromagnetic resonance frequency; integrated magnetic thin film; magnetic thin-film performance; miniature loops coils; noise receiver; noise transmitter; on-chip intra decoupling measurements; on-chip noise suppressor; test element group chip; Coils; Magnetic films; Magnetic flux; Magnetic resonance; Noise; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237961