DocumentCode :
2595400
Title :
Simulation of Particle Trajectories in a Three Phase Common Enclosure Gas Insulated Busduct with Monte Carlo Technique
Author :
Rao, M. Venu Gopala ; Kumar, M. I Nagesh ; Amarnath, J. ; Kamakshaiah, S.
Author_Institution :
QIS Coll. of Eng. & Technol., Ongole
fYear :
2008
fDate :
26-29 Oct. 2008
Firstpage :
594
Lastpage :
597
Abstract :
The excellent insulation properties of compressed sulphur hexaflouride are adversely affected by metallic particle contamination in practical gas insulated systems. The movement of such particles is random and the particles play a crucial role in determining the insulation behavior of GIS. Aluminum, copper and silver particles were considered to be present on enclosure surface. In order to determine the random behavior of moving particles, the calculation of movement in axial and radial directions was carried at every time step using rectangular random numbers. Simulation of particle movement with reduced phase conductor is also carried out with a view to obtain optimum size of conductor for reliable operation by reducing the original diameter of the conductor from 64 mm to 54 mm in steps of 5 mm. At each reduced diameter the particle movement is calculated at each instant in both radial and axial directions using Monte Carlo Technique. Monte Carlo simulation is also carried out by changing the random solid angle from 1 degree to 0.5 degrees. The results have been presented and analyzed.
Keywords :
Monte Carlo methods; SF6 insulation; gas insulated substations; GIS insulation; Monte Carlo technique; compressed sulphur hexaflouride; metallic particle contamination; particle movement simulation; particle trajectory simulation; phase conductor; practical gas insulated substations; three phase gas insulated busduct; Conductors; Contamination; Dielectrics and electrical insulation; Gas insulation; Geographic Information Systems; Monte Carlo methods; Power system reliability; Substations; Sulfur hexafluoride; Voltage; Electric Field; Gas Insulated Substations; Metallic Particles; Particle Contamination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
Conference_Location :
Quebec, QC
Print_ISBN :
978-1-4244-2548-8
Electronic_ISBN :
978-1-4244-2549-5
Type :
conf
DOI :
10.1109/CEIDP.2008.4772858
Filename :
4772858
Link To Document :
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