DocumentCode
2595446
Title
Comparison of characterization methods for statistical analysis of SoC designs
Author
Kim, Wook ; Hyun, Dai Joon ; Kim, Young Hwan ; Do, Kyung Tae
Author_Institution
Div. of Electr. & Comput. Eng., Pohang Univ. of Sci. & Technol., Pohang
Volume
2
fYear
2008
fDate
14-17 May 2008
Firstpage
789
Lastpage
792
Abstract
This paper compares characteristics and performances of characterization methods for statistical timing analysis and statistical leakage estimation. Two popular characterization methods, regular grid sampling and distribution based sampling are selected and their features, advantages and disadvantages are discussed. The experimental results performed with ISCAS benchmark circuits showed the accuracy of using two methods in statistical analysis. In statistical timing analysis, distribution based sampling, which is good approach when the variation is not large, shows good performance in terms of accuracy. However, in statistical leakage estimation, regular grid sampling, which is superior when the variation is very large, shows good performance.
Keywords
benchmark testing; statistical analysis; system-on-chip; ISCAS benchmark circuits; SoC designs; distribution based sampling; regular grid sampling; statistical leakage estimation; statistical timing analysis; system-on-chip circuit; Circuit optimization; Computer aided engineering; Delay effects; Delay lines; Design engineering; Knowledge engineering; Performance analysis; Sampling methods; Statistical analysis; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, 2008. ECTI-CON 2008. 5th International Conference on
Conference_Location
Krabi
Print_ISBN
978-1-4244-2101-5
Electronic_ISBN
978-1-4244-2102-2
Type
conf
DOI
10.1109/ECTICON.2008.4600549
Filename
4600549
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