Title :
A new resistor network based forward model for electrical impedance tomography sensors
Author :
Jun Gu ; Yin, Wenlong ; Yannian Rui ; Chao Wang ; Huaxiang Wang
Author_Institution :
Sch. of Mech. & Electron. Eng., Soochow Univ., Suzhou, China
Abstract :
An electrical resistance tomography sensor consists of a set of measurement electrodes. In general, finite element method (FEM) is used to solve the forward problem (i.e. calculate the resistance value for a given conductivity distribution and electrodes setup). In this paper, a new approach is proposed. The equivalent resistor network model of an electrical resistance tomography (ERT) sensor has been obtained from FE (finite element) method. Based on this discrete resistor model, electrical resistance sensors when connecting to external discrete resistor networks can be accurately simulated using conventional circuit theories. This improved forward model (i.e. the ability to incorporate external resistance network) allows more flexible sensor configuration and updated sensitivity matrix and better images to be obtained, which provides a better foundation for the further application of ERT imaging techniques to wider industrial processes.
Keywords :
electric impedance imaging; electric resistance measurement; electrodes; finite element analysis; matrix algebra; resistors; ERT imaging technique; FEM analysis; conductivity distribution; discrete resistor model; electrical impedance tomography sensor; electrical resistance tomography sensor; equivalent resistor network based forward model; finite element method; flexible sensor configuration; industrial process; measurement electrodes; sensitivity matrix; Conductivity; Electric resistance; Electric variables measurement; Electrical resistance measurement; Electrodes; Finite element methods; Impedance; Joining processes; Resistors; Tomography; Electrical resistance tomography (ERT); finite element method; modelling; process imaging; resistor network;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-3352-0
DOI :
10.1109/IMTC.2009.5168445