Title :
Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP)
Author :
Jing Jin ; Meng-Lin Zhai ; Wen-Yan Yin
Author_Institution :
Zhejiang Provincial Key Lab. for Sensing Technol., Zhejiang Univ., Hangzhou, China
Abstract :
Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP) is carried out in this paper. It mainly consists of antenna, limiter, filter, low noise amplifier (LNA), sensitivity control component, and power amplifier (PA), etc. Certain breakdown of the LNA under the impact of an EMP is demonstrated experimentally with different pulse widths, where its first-stage MESFET is damaged clearly. The output responses of the RF channel are simulated using the commercial software ADS for two types of EMP waveforms, respectively. It is evident that the channel performance is degraded seriously, due to the existence of the EMP. Under such circumstances, some special techniques for an effectively protecting the RF channel should be further employed.
Keywords :
Schottky gate field effect transistors; electromagnetic pulse; low noise amplifiers; microwave field effect transistors; microwave power amplifiers; wireless channels; EMP waveforms; LNA; PA; electromagnetic pulse; first-stage MESFET; low noise amplifier; power amplifier; sensitivity control component; susceptibility analysis; wide band RF receiving channel; Electromagnetics; Integrated circuits;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237976
