Electromagnetic susceptibility analysis of ICs using DPI method with consideration of PDN

Author

Pu, Bo ; Lee, Jae Joong ; Kwak, Sang Keun ; Kim, So Young ; Nah, Wansoo

Author_Institution

Dept. of Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea

fYear

2012

fDate

21-24 May 2012

Firstpage

77

Lastpage

80

Abstract

This paper predicts electromagnetic susceptibility (EMS) of integrated circuits (ICs) with novel consideration of complex power distribution network (PDN). For accurate simulation performance, the set-up model is derived in detail, especially the PDN. PDN model is extracted from the physical configuration and also in view of the function of system to express the ground bounce exactly since it is a pivot factor in DPI test for EMS. After measurement, comparison with simulation result is applied to validate the proposed model and estimate the electromagnetic susceptibility of ICs.

Keywords

electromagnetic compatibility; integrated circuit modelling; magnetic susceptibility; DPI method; DPI test; EMC; EMS; IC; PDN consideration; PDN model; electromagnetic compatibility; electromagnetic susceptibility analysis; integrated circuit; power distribution network model; set-up model; Couplers; Electromagnetics; Energy management; Integrated circuit modeling; Power systems; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on

Conference_Location

Singapore

Print_ISBN

978-1-4577-1557-0

Electronic_ISBN

978-1-4577-1558-7

Type

conf

DOI

10.1109/APEMC.2012.6237980

Filename

6237980