Title :
Atmospheric factor under the negative impulse voltages on various test gaps
Author :
Kanchana, S. ; Chotigo, S. ; Pungsiri, B.
Author_Institution :
Dept. of Electr. Eng., King Mongkut´´s Univ. of Technol. Thonburi, Bangkok
Abstract :
This paper dealt with the effect of the atmospheric factors on various test gaps under the standard negative impulse voltage, 1.2/50 mus. The atmospheric factors in this present work were relative humidity, temperature and the ratio of the absolute humidity to the air density correction factor (h/delta). Gaps used were sphere-sphere, rod-plane and rod-rod gaps. The diameter of the sphere was 12.5 cm and the length of the rod was 20 cm. The dimensions of the plane were 4*4 cm2 copper, and 70*70 cm2 steel. The maximum voltage used in this present work was about 230 kV. The results of the breakdown voltage (U50) as a function of atmospheric factors were plotted.
Keywords :
air gaps; humidity; impulse testing; air density correction factor; atmospheric factor; breakdown voltage; negative impulse voltages; relative humidity; rod-plane gaps; rod-rod gaps; size 12.5 cm; size 20 cm; sphere-sphere gaps; test gaps; time 1.2 mus; time 50 mus; Circuit testing; Copper; Diodes; Flashover; Humidity; Impulse testing; Resistors; Steel; Temperature; Voltage; Negative Impulse Voltage; flashover; humidity;
Conference_Titel :
Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, 2008. ECTI-CON 2008. 5th International Conference on
Conference_Location :
Krabi
Print_ISBN :
978-1-4244-2101-5
Electronic_ISBN :
978-1-4244-2102-2
DOI :
10.1109/ECTICON.2008.4600580
