A pad ICIM model for EMC immunity simulation

Accurate prediction of the response of integrated circuit (IC) to electromagnetic interferences (EMI) is increasingly important. In this paper, a precise integrated circuit immunity model (ICIM) of electrostatic discharge (ESD) protection pads is developed and validated. The model consists of a parasitic RC network model and an ESD snapback model. The parameters of the physically-based parasitic RC network model are extracted from specifically designed structures with ESD pads and validated by S-parameter measurement data. The combined model is able to predict the immunity level more precisely and better support the immunity simulation of circuit under direct power injection (DPI) test.