• DocumentCode
    2596058
  • Title

    EMC standards at IC level - status of IEC and technical goals of the SEISME project

  • Author

    Marot, Christian ; Sicard, Etienne

  • Author_Institution
    EADS-IW, Toulouse, France
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    This paper reviews the methods proposed by the International Electrotechnical Commission (IEC) for characterizing and modelling of Electromagnetic Compatibility (EMC) of Integrated Circuits (IC). The development of tools and EMC performance prediction methods is also described in the context of IC obsolescence, through the French research project SEISME.
  • Keywords
    IEC standards; electromagnetic compatibility; integrated circuits; EMC standards; IC level; IC obsolescence context; IEC status; International Electrotechnical Commission; SEISME project; electromagnetic compatibility; integrated circuit level; IEC standards; Immunity testing; Integrated circuit modeling; Proposals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1557-0
  • Electronic_ISBN
    978-1-4577-1558-7
  • Type

    conf

  • DOI
    10.1109/APEMC.2012.6237998
  • Filename
    6237998
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2596058