Black-box modelling of conducted electromagnetic emissions by adjustable complexity support vector regression machines

Author

Ceperic, Vladimir ; Gielen, Georges ; Baric, Adrijan

Author_Institution

FER, Univ. of Zagreb, Zagreb, Croatia

fYear

2012

fDate

21-24 May 2012

Firstpage

17

Lastpage

20

Abstract

A black-box method for modelling of conducted electromagnetic emissions (EME) at an integrated circuit (IC) power supply pin and ground level by adjustable complexity support vector regression machines (ACSVR) is presented. The ACSVR provides a basis for representing the nonlinear dynamic conducted EME. The ACSVR enables accurate modelling of conducted EME according to the IEC 61967-4 1Ω method and allows the adjustment of accuracy versus model simulation speed. As a test case, the EME model of conducted emissions of a 242-transistor voltage reference with offset compensation is presented. The resulting models (implemented in Verilog A) are accurate and fast to execute.

Keywords

IEC standards; electromagnetic compatibility; electronic engineering computing; integrated circuit modelling; nonlinear dynamical systems; regression analysis; support vector machines; ACSVR; IC power supply pin; IEC 61967-4 1Ω method; Verilog A; adjustable-complexity support vector regression machines; black-box modelling; conducted electromagnetic emission; integrated circuit power supply pin; model simulation speed; nonlinear dynamic conducted EME model; offset compensation; transistor voltage reference; Complexity theory; Data models; Integrated circuit modeling; Optimization; Predictive models; Support vector machines;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on

Conference_Location

Singapore

Print_ISBN

978-1-4577-1557-0

Electronic_ISBN

978-1-4577-1558-7

Type

conf

DOI

10.1109/APEMC.2012.6238017

Filename

6238017