DocumentCode :
2596473
Title :
Direct simulation of material permittivities by using an eigen-susceptibility formulation of the vector variational approach
Author :
Gaebler, Alexander ; Goelden, Felix ; Mueller, Steffen ; Penirschke, Andreas ; Jakoby, Rolf
Author_Institution :
Wireless Commun. Lab., Tech. Univ. Darmstadt, Darmstadt, Germany
fYear :
2009
fDate :
5-7 May 2009
Firstpage :
463
Lastpage :
467
Abstract :
This paper presents a new method for the extraction of material parameters, in this case the permittivity, by formulating the Maxwell equations as an eigen-susceptibility problem of the considered sample. This offers a direct solution of the desired material parameters by utilizing adequate and well proven numerical techniques. Hence, it is very useful if analytical approaches do not provide the aimed accuracy or even fail completely. The procedure will be demonstrated by applying the variational approach to a triple mode cavity perturbation method for the characterization of the complex permittivity tensor of general biaxial anisotropic media.
Keywords :
Maxwell equations; anisotropic media; eigenvalues and eigenfunctions; microwave measurement; permittivity measurement; perturbation techniques; variational techniques; vectors; CST Microwave Studio eigenmode-simulation; Maxwell equations; complex permittivity tensor characterization; direct simulation; eigen-susceptibility formulation; general biaxial anisotropic media; material permittivity extraction; numerical technique; triple mode cavity perturbation method; vector variational approach; Anisotropic magnetoresistance; Cavity perturbation methods; Computational modeling; Dielectric materials; Failure analysis; Maxwell equations; Permittivity; Resonance; Resonant frequency; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE
Conference_Location :
Singapore
ISSN :
1091-5281
Print_ISBN :
978-1-4244-3352-0
Type :
conf
DOI :
10.1109/IMTC.2009.5168493
Filename :
5168493
Link To Document :
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