Title :
Thermal characterization of thermally conductive underfill for a flip-chip package using novel temperature sensing technique
Author :
Lee, W.S. ; Han, I.Y. ; Yu, Jin ; Kim, S.J. ; Lee, T.Y.
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejon
Abstract :
The thermal characteristics of thermally conductive underfill in flip chip package was studied. To enhance the thermal conductivity of underfill, the epoxy was mixed with thermally conductive fillers, such as silica (1.5W/mK), alumina (36W/mK), or diamond (2000W/mK). Coefficient of thermal expansion (CTE) was changed by filler and its content, and CTE was 28 ppm for 60 wt% silica, 39 ppm for 60 wt% alumina and 24 ppm for 60 wt% diamond. Thermal conductivity was calculated from the measurement of thermal diffusivity, density and specific heat capacity under the various temperature conditions with the various fillers. To investigate thermal characteristics of different underfill, diode temperature sensor array (DTSA) was fabricated, which consists of 32 by 32 array of diodes (1,024 diodes) for temperature measurement and 8 heaters for heat source on a 8mm by 8mm of silicon surface. The DTSA was packaged by flip chip packaging method and applied with the same power (0.84W) for different underfilled packages. Finally, the thermal simulations with ICEPAK matched very well with the measurement
Keywords :
alumina; array signal processing; diamond; diodes; flip-chip devices; polymers; silicon; temperature sensors; thermal conductivity; thermal diffusivity; thermal expansion; 0.84 W; Al; C; Si; alumina; coefficient of thermal expansion; diamond; diode temperature sensor array; flip chip packaging method; flip-chip package; silica; specific heat capacity; temperature measurement; temperature sensing technique; thermal characterization; thermal conductivity; thermal diffusivity; thermal simulation; thermally conductive underfill; Conductivity measurement; Density measurement; Diodes; Flip chip; Packaging; Sensor arrays; Silicon compounds; Temperature sensors; Thermal conductivity; Thermal expansion;
Conference_Titel :
Electronics Packaging Technology Conference, 2004. EPTC 2004. Proceedings of 6th
Conference_Location :
Singapore
Print_ISBN :
0-7803-8821-6
DOI :
10.1109/EPTC.2004.1396575