Title :
Open series fault comparison in AC & DC micro-grid architectures
Author :
Estes, H.B. ; Kwasinski, A. ; Hebner, R.E. ; Uriarte, F.M. ; Gattozzi, A.L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
Abstract :
This paper explores empirical observations of open series fault (arc fault) testing during current interruptions. Emphasis is on dc systems, but arc behavior is also compared to that of ac systems under "quasi-equivalent" circuit parameters. Specific parameters that are considered regarding arc behavior include gap voltage, current, dissipated power, voltage and current transient characteristics, reignition, bus disturbances, and contact position during dc arc collapse. Based on these results, comparisons between ac and dc systems seem to indicate that different arc-related challenges exist for both dc and ac architectures.
Keywords :
arcs (electric); distributed power generation; fault diagnosis; power distribution faults; power generation faults; AC microgrid architecture; DC microgrid architecture; arc fault testing; bus disturbance; contact position; current interruption; current transient; dissipated power; gap voltage; open series fault comparison; reignition; Impedance; arc transient; current interruption; direct current; micro-grid; open series fault; spike;
Conference_Titel :
Telecommunications Energy Conference (INTELEC), 2011 IEEE 33rd International
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4577-1249-4
Electronic_ISBN :
2158-5210
DOI :
10.1109/INTLEC.2011.6099883