DocumentCode :
2596733
Title :
Open series fault comparison in AC & DC micro-grid architectures
Author :
Estes, H.B. ; Kwasinski, A. ; Hebner, R.E. ; Uriarte, F.M. ; Gattozzi, A.L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
fYear :
2011
fDate :
9-13 Oct. 2011
Firstpage :
1
Lastpage :
6
Abstract :
This paper explores empirical observations of open series fault (arc fault) testing during current interruptions. Emphasis is on dc systems, but arc behavior is also compared to that of ac systems under "quasi-equivalent" circuit parameters. Specific parameters that are considered regarding arc behavior include gap voltage, current, dissipated power, voltage and current transient characteristics, reignition, bus disturbances, and contact position during dc arc collapse. Based on these results, comparisons between ac and dc systems seem to indicate that different arc-related challenges exist for both dc and ac architectures.
Keywords :
arcs (electric); distributed power generation; fault diagnosis; power distribution faults; power generation faults; AC microgrid architecture; DC microgrid architecture; arc fault testing; bus disturbance; contact position; current interruption; current transient; dissipated power; gap voltage; open series fault comparison; reignition; Impedance; arc transient; current interruption; direct current; micro-grid; open series fault; spike;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Telecommunications Energy Conference (INTELEC), 2011 IEEE 33rd International
Conference_Location :
Amsterdam
ISSN :
2158-5210
Print_ISBN :
978-1-4577-1249-4
Electronic_ISBN :
2158-5210
Type :
conf
DOI :
10.1109/INTLEC.2011.6099883
Filename :
6099883
Link To Document :
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