Title :
Telepower cost benefit model
Author :
Ecker, Annick ; Critical, Frank Bodi Mission
Author_Institution :
Mission Critical Assets, Silcar Pty Ltd., Melbourne, VIC, Australia
Abstract :
Telepower cost benefit model has been developed to predict changes in OPEX and CAPEX expenditure in relation to Telecoms network reliability. The development is based on an advanced simulation engine which models the complex interactions of operational and capital expenditure effects on batteries, rectifiers, solar systems and other telecommunications infrastructure. The effects of business expenditure and its actual impact in the areas of critical power infrastructure may be calculated prior to the cost decision being implemented. The model permits the application of many different reliability and cost scenarios to arrive at a suitable trade-off between cost and reliability. The paper will present the results obtained in developing the model to take account of a complex set of factors including: · equipment performance (MTBF, MTTR, etc) · varying power system types and designs · emergency callout (EC) · planned maintenance (PM) · capital expenditure (CAPEX) · external factors The paper will outline the cost benefit model describing the core components and discussing its strengths and limitations. The cost benefit model is an advanced computer simulation tool developed for the needs of Telecom network power to provide advanced analysis and forecasting capabilities. The paper will present results showing predictions from the model against actual field data.
Keywords :
cost-benefit analysis; critical infrastructures; telecommunication network reliability; telecommunication power supplies; CAPEX expenditure; OPEX expenditure; business expenditure; rectifiers; solar systems; telecom network power; telecoms network reliability; telepower cost benefit model; Analytical models; Data models; Databases; Engines; Nickel; Reliability; Uninterruptible power systems;
Conference_Titel :
Telecommunications Energy Conference (INTELEC), 2011 IEEE 33rd International
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4577-1249-4
Electronic_ISBN :
2158-5210
DOI :
10.1109/INTLEC.2011.6099886