Title :
A Generalized Formulation of Augmented Drift-Diffusion Transport Suitable for Use in General Purpose Device Simulators
Author :
Blakey, P.A. ; Wang, X.L. ; Maziar, C.M.
Author_Institution :
Motorola
Keywords :
Computational modeling; Degradation; Doping; Electron mobility; Equations; Microelectronics; Silicon; Steady-state; Temperature; Tensile stress;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
DOI :
10.1109/NUPAD.1990.748265
