Title :
Modeling a SCR-based protection structure for RF-ESD co-design simulations
Author :
Romanescu, A. ; Ferrari, P. ; Arnould, J. ; Fonteneau, P. ; Legrand, C.
Author_Institution :
Institute of Microelectronics Electromagnetism and Photonics, Grenoble, France
Abstract :
Summary form only given, as follows. Electrostatic discharge protection is a must in every integrated circuit. At microwave frequencies, the influence the protection devices have over the circuit they protect can significantly impact the functioning of the latter. A model for the SCR (silicon controlled rectifier) and the ESD protection diode was developed. Its purpose is to estimate this influence at frequencies up to 65 GHz. A complex device, the DTSCR (diode triggered SCR) is used to demonstrate the consistency of the models.
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5973482