WE4A: Advanced circuit and material measurement

This session begins with a new multi-port measurement technique for characterizing dense via arrays. The second paper describes a method for measuring the dielectric properties of liquids using microwave oscillators. Next, a broadband, non-destructive technique for measuring dielectric substrates using a dual coaxial probe system is reported. The final paper investigates the use of a substrate integrated waveguide probe for characterizing the dielectric properties of liquids up to 30 GHz.