Title :
Impact of front-end non-idealities on bit error rate performance of WLAN-OFDM transceivers
Author :
Côme, B. ; Ness, R. ; Donnay, S. ; Van der Perre, Liesbet ; Eberle, W. ; Wambacq, P. ; Engels, M. ; Bolsens, I.
Author_Institution :
IMEC, Heverlee, Belgium
Abstract :
New OFDM-based WLAN standards target wireless communications in the 5 GHz band for consumer multimedia applications. Given the high data rates with required low bit error rates, and given the nature of the OFDM signal, a conservative analysis of the front-end requirements lead to severe, over dimensioned specifications. Such a design would never meet this market, by necessity low-cost and low-power. To extract more optimal front-end specifications, we assess the BER performance of the complete WLAN-OFDM link. As a result, we first show that the transmitted symbols´ word-length can be restricted to 8-bit and the normalized crest factor digitally limited at baseband to 4. Then we show that the power amplifier can operate with only 5.4 dB back-off between the average input power and the input-referred PldB. Finally, we quantify in terms of implementation loss the influence of the I/Q imbalance and of the frequency synthesizer phase noise
Keywords :
OFDM modulation; error statistics; microwave links; microwave power amplifiers; multimedia communication; transceivers; wireless LAN; 5 GHz; 8 bit; BER performance; I/Q imbalance; OFDM signal; OFDM-based WLAN standards; SHF; WLAN-OFDM link; WLAN-OFDM transceivers; average input power; back-off; baseband; bit error rate performance; consumer multimedia applications; frequency synthesizer phase noise; high data rates; implementation loss; low bit error rates; nonideal front-end; normalized crest factor; optimal front-end specifications; power amplifier; transmitted symbol word-length; wireless communications; Baseband; Bit error rate; Communication standards; Data mining; Multimedia systems; OFDM; Power amplifiers; Signal analysis; Wireless LAN; Wireless communication;
Conference_Titel :
Radio and Wireless Conference, 2000. RAWCON 2000. 2000 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-6267-5
DOI :
10.1109/RAWCON.2000.881863