Title :
Next generation TPS architecture
Author :
Poon, Andrew ; Bertch, William J. ; Wood, Jay B.
Author_Institution :
General Dynamics, San Diego, CA, USA
Abstract :
The authors describe the symptom-model-based (SMB) approach, which correlates the failure symptom with the ambiguity group using historical data and diagnostic knowledge of the specific line replaceable units (LRUs). The SMB approach incorporates three key techniques for developing a next-generation TPS (test program set) architecture. The first technique is model-based diagnosis, which involves isolating the cause of failure based on the defined structure and functions of the components. Several different techniques and levels of detail for modeling an LRU are considered. The second technique is empirical diagnosis, which involves computing the most probable cause of failure using historical data and results from failure modes and effects analysis (FMEA). The third technique is rule-based diagnosis, which uses the knowledge of experts to isolate failures in an expedient manner. The implementation of each of these techniques is evaluated based on the capability to replace the fault with the correct component, the time to isolate the fault and the complexity of the associated TPS structure
Keywords :
automatic test equipment; failure analysis; fault location; knowledge based systems; ATE; TPS architecture; diagnostic knowledge; empirical diagnosis; failure modes and effects analysis; model-based diagnosis; rule-based diagnosis; specific line replaceable units; symptom model based diagnostics; test program set; Application software; Artificial intelligence; Cams; Cause effect analysis; Computer interfaces; Databases; Electronic equipment testing; Failure analysis; Guidelines; Isolation technology;
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
DOI :
10.1109/AUTEST.1990.111493