• DocumentCode
    2597818
  • Title

    Next generation TPS architecture

  • Author

    Poon, Andrew ; Bertch, William J. ; Wood, Jay B.

  • Author_Institution
    General Dynamics, San Diego, CA, USA
  • fYear
    1990
  • fDate
    17-21 Sep 1990
  • Firstpage
    51
  • Lastpage
    61
  • Abstract
    The authors describe the symptom-model-based (SMB) approach, which correlates the failure symptom with the ambiguity group using historical data and diagnostic knowledge of the specific line replaceable units (LRUs). The SMB approach incorporates three key techniques for developing a next-generation TPS (test program set) architecture. The first technique is model-based diagnosis, which involves isolating the cause of failure based on the defined structure and functions of the components. Several different techniques and levels of detail for modeling an LRU are considered. The second technique is empirical diagnosis, which involves computing the most probable cause of failure using historical data and results from failure modes and effects analysis (FMEA). The third technique is rule-based diagnosis, which uses the knowledge of experts to isolate failures in an expedient manner. The implementation of each of these techniques is evaluated based on the capability to replace the fault with the correct component, the time to isolate the fault and the complexity of the associated TPS structure
  • Keywords
    automatic test equipment; failure analysis; fault location; knowledge based systems; ATE; TPS architecture; diagnostic knowledge; empirical diagnosis; failure modes and effects analysis; model-based diagnosis; rule-based diagnosis; specific line replaceable units; symptom model based diagnostics; test program set; Application software; Artificial intelligence; Cams; Cause effect analysis; Computer interfaces; Databases; Electronic equipment testing; Failure analysis; Guidelines; Isolation technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
  • Conference_Location
    San Antonio, TX
  • Type

    conf

  • DOI
    10.1109/AUTEST.1990.111493
  • Filename
    111493