The INMOS integrated parametric test and analysis system

Author

Cheung, D. ; Clark, A. ; Starr, R.

Author_Institution

INMOS Ltd., Newport, UK

fYear

1989

fDate

13-14 March 1989

Firstpage

45

Lastpage

50

Abstract

A distributed software package which simplifies the automation of parametric test program generation and data analysis is described. This parametric test and analysis system is designed to standardize parametric testing, hardware, and controlling software and thereby reduce test program development time. It is designed primarily for the test engineer whose responsibilities include the specification of tests and evaluation of data collected on semiconductor devices. It can also assist process engineers with the development of new parametric programs. It is used in a fabrication facility where engineering evaluation and characterization of test pattern data are used for the purpose of process control and for design feedback.

Keywords

automatic testing; electronic engineering computing; integrated circuit testing; production testing; semiconductor device testing; software packages; INMOS; data analysis; design feedback; distributed software package; engineering evaluation; parametric test program generation; process control; semiconductor devices; test pattern data; test program development time; Automatic testing; Automation; Data analysis; Data engineering; Design engineering; Hardware; Semiconductor device testing; Software packages; Software testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1989. ICMTS 1989. Proceedings of the 1989 International Conference on

Print_ISBN

0-87942-714-0

Type

conf

DOI

10.1109/ICMTS.1989.39279

Filename

39279