Title :
Research Toward a Physics of Aging of Electronic Component Parts
Author :
Thomas, Ralph E. ; Gorton, H.Clay
Author_Institution :
Battelle Memorial Institute, Columbus, Ohio
Abstract :
The document that should appear here is not currently available.
Keywords :
Accelerated aging; Acceleration; Data analysis; Electronic components; Equations; Life estimation; Physics; Stress; Temperature; Testing;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362236
