DocumentCode

2597918

Title

Stress-Strength Theory and Its Transformation into Reliability Functions

Author

Tiger, B. ; Weir, K.

Author_Institution

Radio Corporation of America, Defense Electronic Products, Camden, New Jersey

fYear

1963

fDate

Sept. 1963

Firstpage

94

Lastpage

101

Keywords

Data analysis; Gaussian distribution; Mathematical model; Reliability theory; Resonance; Safety devices; Temperature; Testing; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1963. Second Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1963.362239

Filename

4207590