Title :
Some Failure Mechanisms at Insulator-Conductor Junctions
Author :
Shirn, G.A. ; Smyth, D.M.
Author_Institution :
Research Center, Sprague Electric Company, North Adams, Massachusetts
Keywords :
Capacitors; Chemicals; Conductivity; Degradation; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Failure analysis; Solids; Temperature;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362243
