DocumentCode :
2598152
Title :
Applicatiorn of the Electron Microprobe Analyzer to the Study of Silicon Switching Diodes
Author :
Pietrokowsky, Paul
Author_Institution :
North American Aviation, Inc., Autonetics, Anaheim, California
fYear :
1963
fDate :
Sept. 1963
Firstpage :
245
Lastpage :
267
Keywords :
Atomic measurements; Electron beams; Instruments; Particle scattering; Physics; Semiconductor diodes; Semiconductor impurities; Silicon; Solid state circuits; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1963.362249
Filename :
4207600
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2598152
بازگشت