Title :
Burst Noise in Semiconductor Devices
Author :
Card, W.Howard ; Mavretic, Anton
Author_Institution :
Syracuse University, Syracuse, New York
Keywords :
Autocorrelation; Current measurement; Gaussian noise; Low-frequency noise; Magnetic noise; Noise measurement; Random processes; Semiconductor device noise; Semiconductor devices; Voltage;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362250
