Title :
On the Degradation of Gallium Arsenide Tunnel Diodes
Author_Institution :
Department of Electrical Engineering, Syracuse University, Syracuse, New York
Keywords :
Degradation; Diodes; Equations; Gallium arsenide; Gold; Photonic band gap; Radiation detectors; Temperature; Testing; Voltage;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362253
