Title :
Beat: Boolean expression fault-based test case generator
Author :
Chen, T.Y. ; Grant, D.D. ; Lau, M.F. ; Ng, S.P. ; Vasa, V.R.
Author_Institution :
Sch. of Inf. Technol., Swinburne Univ. of Technol., Hawthorn, Vic., Australia
Abstract :
We present a system which generates test cases from Boolean expressions. The system is based on the integration of several fault-based test case selection strategies developed by us. Our system generates test cases that are guaranteed to detect all single operator fault and all single operand faults when the Boolean expression is in irredundant disjunctive normal form. Apart from being an automated test case generation tool developed for software testing practitioners, this system can also be used as a training or self-learning tool for students as well as software testing practitioners.
Keywords :
Boolean functions; program testing; Boolean expression fault-based test case generator; automated test case generation tool; black-box testing; disjunctive normal form; self-learning tool; single operand fault; single operator fault; software testing practitioner; specification-based testing; Australia; Automatic testing; Computer aided software engineering; Fault detection; Information technology; Programming; Software testing; System testing; Terminology; Traffic control;
Conference_Titel :
Information Technology: Research and Education, 2003. Proceedings. ITRE2003. International Conference on
Print_ISBN :
0-7803-7724-9
DOI :
10.1109/ITRE.2003.1270695