A probing algorithm for circuits containing feedback

Author

Havlicsek, Bruce L.

Author_Institution

Westinghouse Electr. Corp., Hunt Valley, MD, USA

fYear

1990

fDate

17-21 Sep 1990

Firstpage

77

Lastpage

83

Abstract

A guided probe diagnostic algorithm that isolates faults in circuits that may contain feedback loops is presented. The algorithm is shown to isolate faults to the smallest set of components consistent with the diagnostic model. The diagnostic model and its assumptions are described in detail. A proof of the accuracy of the diagnostic algorithm is given. Heuristics for selecting measurement points based on topology or failure statistics are explained. Attention is also given to the development of the probing algorithm in the Ada programming language, and research on the automatic extraction of diagnostic models from computer-aided design systems

Keywords

Ada; automatic test equipment; automatic testing; circuit CAD; electronic equipment testing; failure analysis; feedback; Ada programming language; VHDL; VHSIC; automatic extraction; computer-aided design; diagnostic model; failure statistics; fault isolation; feedback loops; guided probe diagnostic algorithm; heuristics; probing algorithm; Circuit faults; Circuit testing; Computer languages; Design automation; Feedback circuits; Feedback loop; Heuristic algorithms; History; Topology;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.

Conference_Location

San Antonio, TX

Type

conf

DOI

10.1109/AUTEST.1990.111496

Filename

111496