DocumentCode :
2598393
Title :
Failure Modes in Integrated and Partially Integrated Microelectronic Circuits
Author :
Anderson, G.P. ; Erickson, R.A.
Author_Institution :
UNIVAC, St. Paul, Minnesota
fYear :
1963
fDate :
Sept. 1963
Firstpage :
498
Lastpage :
524
Keywords :
Consumer electronics; Costs; Environmental economics; Fabrication; Failure analysis; History; Integrated circuit technology; Materials reliability; Microelectronics; Reflection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1963.362264
Filename :
4207615
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2598393
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