A programmable-load CMOS ring oscillator/inverter chain for propagation-delay measurements

Author

Lippe, K. ; Kerkhoff, H. ; Kloppers, G. ; Morskieft, N.

Author_Institution

Twente Univ., Enschede, Netherlands

fYear

1989

fDate

13-14 March 1989

Firstpage

225

Lastpage

226

Abstract

A description is given of a test structure consisting of a combination of a ring oscillator and an inverter chain. The circuit can be used to carry out propagation delay measurements on two circuit types and under a number of load conditions. Full characterization only takes one test circuit. The elements of this structure are connected to a programmable load varying from a fan-in of 1 up to a fan-in of 15. In this way, the operating environment of the circuit can be simulated in hardware. The measurements can be carried out by means of a conventional automated digital measurement system providing AC and DC parametric measurement capabilities.

Keywords

CMOS integrated circuits; automatic testing; delays; integrated circuit testing; time measurement; AC parametric measurement; DC parametric measurement; automated digital measurement system; fan-in; load conditions; operating environment; programmable-load CMOS ring oscillator/inverter chain; propagation-delay measurements; test structure; CMOS technology; Circuit simulation; Circuit testing; Frequency measurement; Inverters; Logic circuits; Performance evaluation; Propagation delay; Pulse measurements; Ring oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1989. ICMTS 1989. Proceedings of the 1989 International Conference on

Print_ISBN

0-87942-714-0

Type

conf

DOI

10.1109/ICMTS.1989.39313

Filename

39313