Title :
Observations of the Physics of Failure of Semiconductor Devices by X-ray Radiography
Author_Institution :
Delco Radio Division, G.M.C., Kokomo, Indiana
Keywords :
Bonding; Breakdown voltage; Electric breakdown; Failure analysis; Physics; Prototypes; Radiography; Rectifiers; Semiconductor devices; Testing;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362265
