DocumentCode
2598446
Title
Important Mechanism Contributing to Tunnel Diode Failure
Author
Nanavati, R.P.
Author_Institution
Syracuse University, Syracuse, New York
fYear
1963
fDate
Sept. 1963
Firstpage
550
Lastpage
559
Keywords
Gallium arsenide; Nitrogen; Photonic crystals; Radiation detectors; Semiconductor diodes; Silicon radiation detectors; Temperature; Testing; Threshold voltage; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1963.362267
Filename
4207618
Link To Document