DocumentCode
2598462
Title
An opamp as a tool for testing
Author
Sansen, W. ; Eynde, F.O. ; Gielen, G.
Author_Institution
Dept. of Electrotech., Catholic Univ. of Leuven, Heverlee, Belgium
fYear
1989
fDate
13-14 March 1989
Firstpage
239
Lastpage
242
Abstract
A measurement technique is presented to test operational amplifiers and derive their small-signal parameters from AC measurements. This procedure is very powerful for characterizing, testing, and debugging operational amplifiers. The procedure has been applied to a standard CMOS Miller-compensated amplifier. It is shown that the simulation results, obtained from SPICE, can considerably differ from the measured data. When this information is fed back to synthesis programs, more reliable designs, which follow the simulated behavior more closely, can result.
Keywords
CMOS integrated circuits; integrated circuit testing; network parameters; operational amplifiers; AC measurements; CMOS Miller-compensated amplifier; SPICE; debugging; design reliability; measurement technique; operational amplifier testing; simulation; small-signal parameters; synthesis programs; Data mining; Impedance; Integrated circuit measurements; Measurement standards; Operational amplifiers; SPICE; Strontium; Testing; Transconductance; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1989. ICMTS 1989. Proceedings of the 1989 International Conference on
Print_ISBN
0-87942-714-0
Type
conf
DOI
10.1109/ICMTS.1989.39316
Filename
39316
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