Title :
An opamp as a tool for testing
Author :
Sansen, W. ; Eynde, F.O. ; Gielen, G.
Author_Institution :
Dept. of Electrotech., Catholic Univ. of Leuven, Heverlee, Belgium
Abstract :
A measurement technique is presented to test operational amplifiers and derive their small-signal parameters from AC measurements. This procedure is very powerful for characterizing, testing, and debugging operational amplifiers. The procedure has been applied to a standard CMOS Miller-compensated amplifier. It is shown that the simulation results, obtained from SPICE, can considerably differ from the measured data. When this information is fed back to synthesis programs, more reliable designs, which follow the simulated behavior more closely, can result.
Keywords :
CMOS integrated circuits; integrated circuit testing; network parameters; operational amplifiers; AC measurements; CMOS Miller-compensated amplifier; SPICE; debugging; design reliability; measurement technique; operational amplifier testing; simulation; small-signal parameters; synthesis programs; Data mining; Impedance; Integrated circuit measurements; Measurement standards; Operational amplifiers; SPICE; Strontium; Testing; Transconductance; Transfer functions;
Conference_Titel :
Microelectronic Test Structures, 1989. ICMTS 1989. Proceedings of the 1989 International Conference on
Print_ISBN :
0-87942-714-0
DOI :
10.1109/ICMTS.1989.39316
